foxBMS - Unit Tests  1.6.0
The foxBMS Unit Tests API Documentation
test_mcu.c
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41 
42 /**
43  * @file test_mcu.c
44  * @author foxBMS Team
45  * @date 2020-04-01 (date of creation)
46  * @updated 2023-10-12 (date of last update)
47  * @version v1.6.0
48  * @ingroup UNIT_TEST_IMPLEMENTATION
49  * @prefix TEST
50  *
51  * @brief Tests for the mcu module
52  *
53  */
54 
55 /*========== Includes =======================================================*/
56 #include "unity.h"
57 
58 #include "mcu.h"
59 
60 /*========== Unit Testing Framework Directives ==============================*/
61 
62 /*========== Definitions and Implementations for Unit Test ==================*/
63 volatile uint32_t MCU_RTI_CNT0_FRC0_REG = 0u;
64 
65 /*========== Setup and Teardown =============================================*/
66 void setUp(void) {
68 }
69 
70 void tearDown(void) {
71 }
72 
73 /*========== Test Cases =====================================================*/
74 void testMCU_Delay_us(void) {
75  MCU_Delay_us(1);
76 }
77 
78 /** test whether #MCU_GetFreeRunningCount() returns the correct value */
80  TEST_ASSERT_EQUAL(0u, MCU_GetFreeRunningCount());
82  TEST_ASSERT_EQUAL(42u, MCU_GetFreeRunningCount());
83 }
84 
85 /** test conversion function for FRC #MCU_ConvertFrcDifferenceToTimespan_us() */
87  TEST_ASSERT_EQUAL(0u, MCU_ConvertFrcDifferenceToTimespan_us(0u));
88 
89  TEST_ASSERT_EQUAL(977u, MCU_ConvertFrcDifferenceToTimespan_us(0xBEEFu));
90 }
uint32_t MCU_GetFreeRunningCount(void)
Get the current value of the Free Running Counter 0 (FRC0)
Definition: mcu.c:123
uint32_t MCU_ConvertFrcDifferenceToTimespan_us(uint32_t count)
Convert the counter value FRC0 to a time in microseconds.
Definition: mcu.c:127
void MCU_Delay_us(uint32_t delay_us)
Wait blocking a certain time in microseconds.
Definition: mcu.c:89
Headers for the driver for the MCU module.
void testMCU_GetFreeRunningCount(void)
Definition: test_mcu.c:79
void testMCU_ConvertFrcDifferenceToTimespan_us(void)
Definition: test_mcu.c:86
void setUp(void)
Definition: test_mcu.c:66
void tearDown(void)
Definition: test_mcu.c:70
void testMCU_Delay_us(void)
Definition: test_mcu.c:74
volatile uint32_t MCU_RTI_CNT0_FRC0_REG
Definition: test_mcu.c:63